The transmission electron microscope (TEM) JEOL-2010F provides morphologic, compositional and crystallographic information on materials at the nanoscale.

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It can be used either for conventional or high resolution TEM imaging. The analytical objective lens pole piece on this microscope allows sample tilting up to 35 degrees and spot selection for dark-field imaging. In addition to conventional imaging, this instrument is equipped with a Gatan heating and cooling sample holders for a wide range of imaging temperatures. The field emission gun can achieve optimum beam current for size-controlled fabrication of nanopore/nano-drilling, and allows for biomaterials imaging.