Laboratory for Surface Modification Facilities

The User Facilities at the Laboratory for Surface Modification possess state-of-the art instrumentation for material analysis. Learn about the instruments, methods, opportunities and solutions available in our facilities.

Our Facilities

XPS

State of the art X-ray Photoemission Spectroscopy (XPS), but also numerous electron spectroscopy techniques are available for surface analysis.

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RBS

Rutherford Back-Scattering spectroscopy (RBS) is a powerful method for determining the structure and elemental composition of thin film samples.

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HIM

Helium Ion Microscopy (HIM) is an incomparable lens to the nanoscale world and a powerfull nanofabrication tool.

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JEOL 2010 TEM

Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) for atomic scale imaging and chemical mapping.

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Nion UltraSTEM

Our aberration corrected Transmission Electron Microscope redefines the limits of TEM resolution and enables unprecedented spectroscopy.

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Other resources

Find other resources available at the Laboratory for Surface Modification and other useful information.

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Rutgers Unique Microscopy Facilities

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