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Laboratory for Surface Modification Facilities

The User Facilities at the Laboratory for Surface Modification possess state-of-the art instrumentation for material analysis. Learn about the instruments, methods, opportunities and solutions available in our facilities.

Our Facilities

Our Facilities

XPS

State of the art X-ray Photoemission Spectroscopy (XPS), but also numerous electron spectroscopy techniques are available for surface analysis.

RBS

Rutherford Back-Scattering spectroscopy (RBS) is a powerful method for determining the structure and elemental composition of thin film samples.

HIM

Helium Ion Microscopy (HIM) is an incomparable lens to the nanoscale world and a powerfull nanofabrication tool.

JEOL 2010 TEM

Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) for atomic scale imaging and chemical mapping.

Nion UltraSTEM

Our aberration corrected Transmission Electron Microscope redefines the limits of TEM resolution and enables unprecedented spectroscopy.

Other resources

Find other resources available at the Laboratory for Surface Modification and other useful information.

Rutgers Unique Microscopy Facilities

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