Dark-field TEM imaging is a well-known technique to examine the domains structure in ferroelectric and nonferroelectric materials owing to its high spatial resolution and ability to isolate specific types of domains using a specific diffraction spot. In particular, we can examine the existence of inversion symmetry by taking advantage of Friedel’s law, where the Friedel-related pairs of Bragg reflections behave differently in a non-centrosymmetric structure.